ISO 20794-7:2020
Road vehicles — Clock extension peripheral interface (CXPI) — Part 7: Data link and physical layer conformance test plan
This document specifies the conformance test plans for the CXPI data link layer and the CXPI physical layer. It also specifies the conformance test plan for error detection.
Additionally, this document describes the concept of conformance test plan operation.
| Get this standard | Prices exclude GST | |
|---|---|---|
| PDF ( Single user document) |
$429.00 NZD | |
| HardCopy |
$473.00 NZD | |
| Networkable PDF |
Price varies
|
Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Symbols and abbreviated terms
4.1 Symbols
4.2 Abbreviated terms
5 Conventions
6 General test specification considerations
6.1 General
6.2 Test conditions
6.3 IUT requirements
6.4 CTC definition
6.5 Test system set-up
6.6 Configuration of test system and IUT
6.6.1 General
6.6.2 IUT-specific set-up parameters
6.6.3 Default configurations
6.6.4 L_ErrDet1 configurations
6.6.5 L_ErrDet2 configurations
6.6.6 L_Arbit configurations
6.6.7 L_Unknown configurations
6.7 SUT initialisation
6.8 Additional test system set-up capabilities
6.8.1 CXPI network data generator
6.8.2 TXD data generator
6.8.3 TXPWM data generator
6.8.4 RXPWM data generator
6.8.5 Other requirements
7 Data link layer conformance test plan
7.1 General
7.2 CTP – Timing parameters
7.2.1 2.CTC_1.1 – IBS length
7.2.2 2.CTC_1.2 – IFS length
7.2.3 2.CTC_1.3 – Frame reception starting condition 1 without the error bit
7.2.4 2.CTC_1.4 – Frame reception starting condition 1 with the error bit
7.2.5 2.CTC_1.5 – Frame reception starting condition 2 without the error bit
7.2.6 2.CTC_1.6 – Frame reception starting condition 2 with the error bit
7.2.7 2.CTC_1.7 – Frame reception starting condition 3
7.2.8 2.CTC_1.8 – Maximum length of the frame
7.3 CTP – Frame transmission/reception
7.3.1 2.CTC_2.1 – Response to L_PID field
7.3.2 2.CTC_2.2 – L_PID field transmission
7.3.3 2.CTC_2.3 – L_PTYPE field transmission
7.3.4 2.CTC_2.4 – L_PTYPE field response function
7.3.5 2.CTC_2.5 – L_FI_DLC ≠ 11112 and frame data verification 1
7.3.6 2.CTC_2.6 – L_FI_DLC ≠ 11112 and frame data verification 2 if DLC is 11012 or 11102 (Ftype = NormalCom)
7.3.7 2.CTC_2.7 – L_FI_DLC = 11112/L_FI_DLCext ≥ 0 and frame data verification
7.3.8 2.CTC_2.8 – Given CRC of frame with L_FI_DLC ≠ 11112
7.3.9 2.CTC_2.9 – Given CRC of frame with L_FI_DLC = 11112/L_FI_DLCext ≥ 0
7.3.10 2.CTC_2.10 – Frame transmission completion
7.3.11 2.CTC_2.11 – Frame reception completion
7.4 CTP – Network access
7.4.1 2.CTC_3.1 – Arbitration function 1 (arbitration by using carrier sense)
7.4.2 2.CTC_3.2 – Arbitration function 2 (IUT loses arbitration and transitions into receiving state)
7.5 CTP – Error detection
7.5.1 2.CTC_4.1 – Byte error
7.5.2 2.CTC_4.2 – CRC error
7.5.3 2.CTC_4.3 – Parity error of the L_PID field without the error bit
7.5.4 2.CTC_4.4 – Parity error of the L_PID field with the error bit
7.5.5 2.CTC_4.5 – Parity error of the L_PTYPE field without the error bit
7.5.6 2.CTC_4.6 – Parity error of the L_PTYPE field with the error bit
7.5.7 2.CTC_4.7 – Data length code error with L_FI_DLC ≠ 11112
7.5.8 2.CTC_4.8 – Data length error with L_FI_DLC = 11112/L_FI_DLCext ≥ 0
7.5.9 2.CTC_4.9 – Data length code error L_FI_DLC ≠ 11112 and if DLC is 11012 or 11102 (Ftype = DiagNodeCfg)
7.5.10 2.CTC_4.10 – Data length code error L_FI_DLC = 11112/L_FI_DLCext ≤ 12 (Ftype = DiagNodeCfg)
7.5.11 2.CTC_4.11 – Framing error in receiving node
7.5.12 2.CTC_4.12 – Framing error in transmitting node
7.5.13 2.CTC_4.13 – Ignore error (no support of L_FI_DLC = 11112)
8 Physical layer conformance test plan (PMA – PS separate type)
8.1 CTP – Operational conditions and calibration
8.1.1 Initial configuration
8.1.2 1.CTC_1.1 – Clock transmission 1
8.1.3 1.CTC_1.2 – Clock transmission 2
8.1.4 1.CTC_1.3 – Clock transmission 3
8.1.5 1.CTC_1.4 – Detection of clock existence
8.1.6 1.CTC_1.5 – Arbitration function (stop transmission by arbitration)
8.1.7 1.CTC_1.6 – Operating voltage range
8.1.8 1.CTC_1.7 – Bit synchronisation
8.2 CTP – Wake-up pulse
8.2.1 General
8.2.2 1.CTC_2.1 – Wake-up pulse reception 1, IUT as master node
8.2.3 1.CTC_2.2 – Wake-up pulse reception 2, IUT as slave node
8.2.4 1.CTC_2.3 – Wake-up pulse transmission
8.3 CTP – Voltage and duty cycle thresholds
8.3.1 General
8.3.2 Voltage threshold test set-up
8.3.3 1.CTC_3.1 – Voltage threshold test 1
8.3.4 1.CTC_3.2 – Voltage threshold (VDom_TS up) test 2
8.3.5 1.CTC_3.2 – Voltage threshold test 2
8.3.6 1.CTC_3.3 – Duty cycle threshold test 1
8.3.7 1.CTC_3.4 – Duty cycle threshold test 2
8.4 CTP – Network state current characteristics
8.4.1 1.CTC_4.1 – Drive current test
8.4.2 1.CTC_4.2 – Input leakage test
8.4.3 1.CTC_4.3 – Reverse leakage current test
8.5 CTP – Physical signal slope control
8.5.1 1.CTC_5.1 – Duty cycle measurement 1
8.5.2 1.CTC_5.2 – Duty cycle measurement 2
8.5.3 1.CTC_5.3 – Duty cycle measurement 3
8.5.4 1.CTC_5.4 – Propagation delay of the receiver test
8.5.5 1.CTC_5.5 – Propagation delay of the transmitter test
8.5.6 1.CTC_5.6 – Propagation delay of the transmitter test 2
8.5.7 1.CTC_5.7 – Loop back time test
8.6 CTP – GND/VBAT shift test
8.6.1 GND/VBAT shift test set-up
8.6.2 1.CTC_6.1 – GND shift test
8.6.3 1.CTC_6.2 – VBAT shift test
8.7 CTP – Loss of power supply
8.7.1 Loss of battery and Loss of GND test set-up
8.7.2 1.CTC_7.1 – Loss of battery test (VBAT)
8.7.3 1.CTC_7.2 – Loss of GND test
8.8 CTP – Internal static capacity
8.8.1 Internal static capacity test set-up
8.8.2 1.CTC_8.1 Internal static capacity
8.9 CTP – Internal resistance measurement during operation
8.9.1 Internal resistor measurement test set-up
8.9.2 1.CTC_9.1– Internal resistor measurement 1
8.9.3 1.CTC_9.2– Internal resistor measurement 2
9 Physical layer conformance test plan (PS –PMA non-separate type)
9.1 CTP – Operational conditions and calibration
9.1.1 1.CTC_10.1 – Clock transmission
9.1.2 1.CTC_10.2 – Detection of clock existence
9.1.3 1.CTC_10.3 – Arbitration function (stop transmission by arbitration)
9.1.4 1.CTC_10.4 – Operating voltage range
9.2 CTP – Wake-up pulse
9.2.1 General
9.2.2 1.CTC_11.1 – Wake-up pulse reception, IUT as master node
9.2.3 1.CTC_11.2 – Wake-up by clock detection
9.2.4 1.CTC_11.3 – Wake-up pulse transmission
9.3 CTP – Voltage and duty cycle thresholds
9.3.1 General
9.3.2 1.CTC_12.1 – Voltage threshold test 1
9.3.3 1.CTC_12.2 – Voltage threshold test 2
9.3.4 1.CTC_12.3 – Duty cycle threshold test 1
9.3.5 1.CTC_12.4 – Duty cycle threshold test 2
9.4 CTP – Network state current characteristics
9.4.1 1.CTC_13.1 – Drive current test
9.4.2 1.CTC_13.2 – Input leakage test
9.4.3 1.CTC_13.3 – Reverse leakage current test
9.5 CTP – Physical signal slope control
9.5.1 1.CTC_14.1 – Duty cycle measurement 1
9.5.2 1.CTC_14.2 – Duty cycle measurement 2
9.6 CTP – GND/VBAT shift test
9.6.1 GND/VBAT shift test set-up
9.6.2 1.CTC_15.1 – GND shift test
9.6.3 1.CTC_15.2 – VBAT shift test
9.7 CTP – Loss of power supply
9.7.1 General
9.7.2 Loss of battery (VBAT) and GND test set-up
9.7.3 1.CTC_16.1 – Loss of battery test (VBAT)
9.7.4 1.CTC_16.2 – Loss of GND test
9.8 CTP – Internal static capacity
9.8.1 Internal static capacity test set-up
9.8.2 1.CTC_17.1 Internal static capacity
9.9 CTP – Internal resistance measurement during operation
9.9.1 Internal resistor measurement test set-up
9.9.2 1.CTC_18.1– Internal resistor measurement 1
9.9.3 1.CTC_18.2– Internal resistor measurement 2
Bibliography
Keep me up-to-date
Sign up to receive updates when there are changes to this standard
Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Symbols and abbreviated terms
4.1 Symbols
4.2 Abbreviated terms
5 Conventions
6 General test specification considerations
6.1 General
6.2 Test conditions
6.3 IUT requirements
6.4 CTC definition
6.5 Test system set-up
6.6 Configuration of test system and IUT
6.6.1 General
6.6.2 IUT-specific set-up parameters
6.6.3 Default configurations
6.6.4 L_ErrDet1 configurations
6.6.5 L_ErrDet2 configurations
6.6.6 L_Arbit configurations
6.6.7 L_Unknown configurations
6.7 SUT initialisation
6.8 Additional test system set-up capabilities
6.8.1 CXPI network data generator
6.8.2 TXD data generator
6.8.3 TXPWM data generator
6.8.4 RXPWM data generator
6.8.5 Other requirements
7 Data link layer conformance test plan
7.1 General
7.2 CTP – Timing parameters
7.2.1 2.CTC_1.1 – IBS length
7.2.2 2.CTC_1.2 – IFS length
7.2.3 2.CTC_1.3 – Frame reception starting condition 1 without the error bit
7.2.4 2.CTC_1.4 – Frame reception starting condition 1 with the error bit
7.2.5 2.CTC_1.5 – Frame reception starting condition 2 without the error bit
7.2.6 2.CTC_1.6 – Frame reception starting condition 2 with the error bit
7.2.7 2.CTC_1.7 – Frame reception starting condition 3
7.2.8 2.CTC_1.8 – Maximum length of the frame
7.3 CTP – Frame transmission/reception
7.3.1 2.CTC_2.1 – Response to L_PID field
7.3.2 2.CTC_2.2 – L_PID field transmission
7.3.3 2.CTC_2.3 – L_PTYPE field transmission
7.3.4 2.CTC_2.4 – L_PTYPE field response function
7.3.5 2.CTC_2.5 – L_FI_DLC ≠ 11112 and frame data verification 1
7.3.6 2.CTC_2.6 – L_FI_DLC ≠ 11112 and frame data verification 2 if DLC is 11012 or 11102 (Ftype = NormalCom)
7.3.7 2.CTC_2.7 – L_FI_DLC = 11112/L_FI_DLCext ≥ 0 and frame data verification
7.3.8 2.CTC_2.8 – Given CRC of frame with L_FI_DLC ≠ 11112
7.3.9 2.CTC_2.9 – Given CRC of frame with L_FI_DLC = 11112/L_FI_DLCext ≥ 0
7.3.10 2.CTC_2.10 – Frame transmission completion
7.3.11 2.CTC_2.11 – Frame reception completion
7.4 CTP – Network access
7.4.1 2.CTC_3.1 – Arbitration function 1 (arbitration by using carrier sense)
7.4.2 2.CTC_3.2 – Arbitration function 2 (IUT loses arbitration and transitions into receiving state)
7.5 CTP – Error detection
7.5.1 2.CTC_4.1 – Byte error
7.5.2 2.CTC_4.2 – CRC error
7.5.3 2.CTC_4.3 – Parity error of the L_PID field without the error bit
7.5.4 2.CTC_4.4 – Parity error of the L_PID field with the error bit
7.5.5 2.CTC_4.5 – Parity error of the L_PTYPE field without the error bit
7.5.6 2.CTC_4.6 – Parity error of the L_PTYPE field with the error bit
7.5.7 2.CTC_4.7 – Data length code error with L_FI_DLC ≠ 11112
7.5.8 2.CTC_4.8 – Data length error with L_FI_DLC = 11112/L_FI_DLCext ≥ 0
7.5.9 2.CTC_4.9 – Data length code error L_FI_DLC ≠ 11112 and if DLC is 11012 or 11102 (Ftype = DiagNodeCfg)
7.5.10 2.CTC_4.10 – Data length code error L_FI_DLC = 11112/L_FI_DLCext ≤ 12 (Ftype = DiagNodeCfg)
7.5.11 2.CTC_4.11 – Framing error in receiving node
7.5.12 2.CTC_4.12 – Framing error in transmitting node
7.5.13 2.CTC_4.13 – Ignore error (no support of L_FI_DLC = 11112)
8 Physical layer conformance test plan (PMA – PS separate type)
8.1 CTP – Operational conditions and calibration
8.1.1 Initial configuration
8.1.2 1.CTC_1.1 – Clock transmission 1
8.1.3 1.CTC_1.2 – Clock transmission 2
8.1.4 1.CTC_1.3 – Clock transmission 3
8.1.5 1.CTC_1.4 – Detection of clock existence
8.1.6 1.CTC_1.5 – Arbitration function (stop transmission by arbitration)
8.1.7 1.CTC_1.6 – Operating voltage range
8.1.8 1.CTC_1.7 – Bit synchronisation
8.2 CTP – Wake-up pulse
8.2.1 General
8.2.2 1.CTC_2.1 – Wake-up pulse reception 1, IUT as master node
8.2.3 1.CTC_2.2 – Wake-up pulse reception 2, IUT as slave node
8.2.4 1.CTC_2.3 – Wake-up pulse transmission
8.3 CTP – Voltage and duty cycle thresholds
8.3.1 General
8.3.2 Voltage threshold test set-up
8.3.3 1.CTC_3.1 – Voltage threshold test 1
8.3.4 1.CTC_3.2 – Voltage threshold (VDom_TS up) test 2
8.3.5 1.CTC_3.2 – Voltage threshold test 2
8.3.6 1.CTC_3.3 – Duty cycle threshold test 1
8.3.7 1.CTC_3.4 – Duty cycle threshold test 2
8.4 CTP – Network state current characteristics
8.4.1 1.CTC_4.1 – Drive current test
8.4.2 1.CTC_4.2 – Input leakage test
8.4.3 1.CTC_4.3 – Reverse leakage current test
8.5 CTP – Physical signal slope control
8.5.1 1.CTC_5.1 – Duty cycle measurement 1
8.5.2 1.CTC_5.2 – Duty cycle measurement 2
8.5.3 1.CTC_5.3 – Duty cycle measurement 3
8.5.4 1.CTC_5.4 – Propagation delay of the receiver test
8.5.5 1.CTC_5.5 – Propagation delay of the transmitter test
8.5.6 1.CTC_5.6 – Propagation delay of the transmitter test 2
8.5.7 1.CTC_5.7 – Loop back time test
8.6 CTP – GND/VBAT shift test
8.6.1 GND/VBAT shift test set-up
8.6.2 1.CTC_6.1 – GND shift test
8.6.3 1.CTC_6.2 – VBAT shift test
8.7 CTP – Loss of power supply
8.7.1 Loss of battery and Loss of GND test set-up
8.7.2 1.CTC_7.1 – Loss of battery test (VBAT)
8.7.3 1.CTC_7.2 – Loss of GND test
8.8 CTP – Internal static capacity
8.8.1 Internal static capacity test set-up
8.8.2 1.CTC_8.1 Internal static capacity
8.9 CTP – Internal resistance measurement during operation
8.9.1 Internal resistor measurement test set-up
8.9.2 1.CTC_9.1– Internal resistor measurement 1
8.9.3 1.CTC_9.2– Internal resistor measurement 2
9 Physical layer conformance test plan (PS –PMA non-separate type)
9.1 CTP – Operational conditions and calibration
9.1.1 1.CTC_10.1 – Clock transmission
9.1.2 1.CTC_10.2 – Detection of clock existence
9.1.3 1.CTC_10.3 – Arbitration function (stop transmission by arbitration)
9.1.4 1.CTC_10.4 – Operating voltage range
9.2 CTP – Wake-up pulse
9.2.1 General
9.2.2 1.CTC_11.1 – Wake-up pulse reception, IUT as master node
9.2.3 1.CTC_11.2 – Wake-up by clock detection
9.2.4 1.CTC_11.3 – Wake-up pulse transmission
9.3 CTP – Voltage and duty cycle thresholds
9.3.1 General
9.3.2 1.CTC_12.1 – Voltage threshold test 1
9.3.3 1.CTC_12.2 – Voltage threshold test 2
9.3.4 1.CTC_12.3 – Duty cycle threshold test 1
9.3.5 1.CTC_12.4 – Duty cycle threshold test 2
9.4 CTP – Network state current characteristics
9.4.1 1.CTC_13.1 – Drive current test
9.4.2 1.CTC_13.2 – Input leakage test
9.4.3 1.CTC_13.3 – Reverse leakage current test
9.5 CTP – Physical signal slope control
9.5.1 1.CTC_14.1 – Duty cycle measurement 1
9.5.2 1.CTC_14.2 – Duty cycle measurement 2
9.6 CTP – GND/VBAT shift test
9.6.1 GND/VBAT shift test set-up
9.6.2 1.CTC_15.1 – GND shift test
9.6.3 1.CTC_15.2 – VBAT shift test
9.7 CTP – Loss of power supply
9.7.1 General
9.7.2 Loss of battery (VBAT) and GND test set-up
9.7.3 1.CTC_16.1 – Loss of battery test (VBAT)
9.7.4 1.CTC_16.2 – Loss of GND test
9.8 CTP – Internal static capacity
9.8.1 Internal static capacity test set-up
9.8.2 1.CTC_17.1 Internal static capacity
9.9 CTP – Internal resistance measurement during operation
9.9.1 Internal resistor measurement test set-up
9.9.2 1.CTC_18.1– Internal resistor measurement 1
9.9.3 1.CTC_18.2– Internal resistor measurement 2
Bibliography