Skip to main content

IEC 60747-11:1985/AMD1:1991

Withdrawn Date published:

Warning: Withdrawn Standard. This document has been withdrawn without replacement. You may wish to search for a more up to date equivalent.

Amendment 1 - Semiconductor devices. Discrete devices. Part 11: Sectional
specification for discrete devices

Get this standard Prices exclude GST
PDF ( Single user document)
$19.13 NZD
HardCopy
$53.04 NZD
Networkable PDF
Price varies
Preview only close
Prev {{ page }}/ {{ numPages }} Next
Preview only close
Prev {{ page }}/ {{ numPages }} Next
Pages: 5

Related Information

Similar Standards

  • BS 3934-5:1997

    Mechanical standardization of semiconductor devices, Recommendations applying to tape automated bonding (TAB) of integrated circuits

  • BS 7241:1989

    Specification for IEC 822 VSB: parallel sub-system bus of the IEC 821 VME bus

  • BS EN 153000:1998

    Harmonized system of quality assessment for electronic components. Generic specification: discrete pressure contact power semiconductor devices (qualification approval)

  • BS EN 60068-2-13:1999

    Environmental testing. Test methods, Tests. Test M. Low air pressure

Preview only close
Prev {{ page }}/ {{ numPages }} Next
Preview only close
Prev {{ page }}/ {{ numPages }} Next
Pages: 5

IEC 60747-11:1985/AMD1:1991

Get this standard Prices exclude GST
PDF ( Single user document)
$19.13 NZD
HardCopy
$53.04 NZD
Networkable PDF
Price varies

Request to add this standard to your subscription

IEC 60747-11:1985/AMD1:1991

Price varies
Online library subscription

Your organisation’s Account Administrator must approve a request to add a standard to your subscription.

You may add a comment to the administrator below.

Cancel