BS EN IEC 60749-17:2019
Current
Date published:
Semiconductor devices. Mechanical and climatic test methods, Neutron irradiation
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Related Information
31.080.01 Semiconductor devices in general
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BS EN IEC 60749-17:2019
Get this standard
Prices exclude GST
PDF
( Single user document)
$257.39 NZD
PDF
( Single user document)
$0.00 NZD
HardCopy
$293.04 NZD