Skip to main content

BS EN 62047-22:2014

Current Date published:

Semiconductor devices. Micro-electromechanical devices, Electromechanical tensile test method for conductive thin films on flexible substrates

Get this standard Prices exclude GST
PDF ( Single user document)
$257.39 NZD
PDF ( Single user document)
$0.00 NZD
HardCopy
$293.04 NZD
Preview only close
Prev {{ page }}/ {{ numPages }} Next
Preview only close
Prev {{ page }}/ {{ numPages }} Next
Pages: 14

Related Information

Similar Standards

  • BS 559-1:2023

    Interior and exterior signs, Design, manufacture and installation of signs. Specification

  • BS 559-1:2023 - TC

    Tracked Changes. Interior and exterior signs, Design, manufacture and installation of signs. Specification

  • BS CECC 50000:1987

    Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices

  • BS CECC 50000:Supplement No. 1:1983

    Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices. CECC assessed process average

Preview only close
Prev {{ page }}/ {{ numPages }} Next
Preview only close
Prev {{ page }}/ {{ numPages }} Next
Pages: 14

BS EN 62047-22:2014

Get this standard Prices exclude GST
PDF ( Single user document)
$257.39 NZD
PDF ( Single user document)
$0.00 NZD
HardCopy
$293.04 NZD

Request to add this standard to your subscription

BS EN 62047-22:2014

Price varies
Online library subscription

Your organisation’s Account Administrator must approve a request to add a standard to your subscription.

You may add a comment to the administrator below.

Cancel