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BS EN 62047-2:2006

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Semiconductor devices. Micro-electromechanical devices, Tensile testing method of thin film materials

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Related Information

Similar Standards

  • BS CECC 50000:1987

    Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices

  • BS CECC 50000:Supplement No. 1:1983

    Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices. CECC assessed process average

  • BS EN 60146-2:2000

    Semiconductor convertors. General requirements and line commutated convertors, Self-commutated semiconductor converters including direct d.c. converters

  • BS EN 60464-2:2001

    Varnishes used for electrical insulation, Methods of test

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BS EN 62047-2:2006

Get this standard Prices exclude GST
PDF ( Single user document)
$306.96 NZD
PDF ( Single user document)
$283.72 NZD
HardCopy
$343.48 NZD

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