AS/NZS IEC 60947.2:2015
Low-voltage switchgear and controlgear - Part 2: Circuit-breakers
States the characteristics of circuit-breakers and the conditions with which circuit-breakers are required to comply, with reference to operation and behaviour both in normal service and in case of overload, and operation and behaviour under short-circuit, including co-ordination in service (selectivity and back-up protection). It also states tests intended for confirming that these conditions have been met and the methods to be adopted for these tests, and information to be marked on or given with the apparatus. Identical to and reproduced from IEC 60947-2, Ed. 4.2 (2012).
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AS/NZS IEC 60947.2:2015
COPYRIGHT
PREFACE
CONTENTS
1 General
1.1 Scope and object
1.2 Normative references
2 Definitions
3 Classification
4 Characteristics of circuit-breakers
4.1 Summary of characteristics
4.2 Type of circuit-breaker
4.3 Rated and limiting values of the main circuit
4.4 Selectivity categories
4.5 Control circuits
4.6 Auxiliary circuits
4.7 Releases
4.8 Integral fuses (integrally fused circuit-breakers)
5 Product information
5.1 Nature of the information
5.2 Marking
5.3 Instructions for installation, operation and maintenance
6 Normal service, mounting and transport conditions
7 Constructional and performance requirements
7.1 Constructional requirements
7.2 Performance requirements
7.3 Electromagnetic compatibility (EMC)
8 Tests
8.1 Kind of tests
8.2 Compliance with constructional requirements
8.3 Type tests
8.4 Routine tests
Annex A(normative)Co-ordination under short-circuit conditions betweena circuit-breaker and another short-circuit protective deviceassociated in the same circuit
A.1 Introduction
A.2 Scope and object
A.3 General requirements for the co-ordination of a circuit-breakerwith another SCPD
A.4 Type and characteristics of the associated SCPD
A.5 Verification of selectivity
A.6 Verification of back-up protection
Annex B(normative)Circuit-breakers incorporating residual current protection
INTRODUCTION
B.1 Scope and object
B.2 Definitions
B.3 Classification
B.4 Characteristics of CBRs concerning their residual current function
B.5 Marking
B.6 Normal service, mounting and transport conditions
B.7 Design and operating requirements
B.8 Tests
Annex C(normative)Individual pole short-circuit test sequence
C.1 General
C.2 Test of individual pole short-circuit breaking capacity
C.3 Verification of dielectric withstand
C.4 Verification of overload releases
Annex DVacant
Annex E(informative)Items subject to agreement between manufacturer and user
Annex F(normative)Additional tests for circuit-breakers withelectronic over-current protection
F.1 Scope
F.2 List of tests
F.3 General test conditions
F.4 Immunity tests
F.5 Emission tests
F.6 Suitability for multiple frequencies
F.7 Dry heat test
F.8 Damp heat test
F.9 Temperature variation cycles at a specified rate of change
Annex G(normative)Power loss
G.1 General
G.2 Test methods
G.3 Test procedure
Annex H(normative)Test sequence for circuit-breakers for IT systems
H.1 General
H.2 Individual pole short circuit
H.3 Verification of dielectric withstand
H.4 Verification of overload releases
H.5 Marking
Annex J(normative)Electromagnetic compatibility (EMC) –Requirements and test methods for circuit-breakers
J.1 General
J.2 Immunity
J.3 Emission
Annex K(informative)Glossary of symbols and graphical representation of characteristics
Annex L(normative)Circuit-breakers not fulfilling the requirementsfor overcurrent protection
L.1 Scope
L.2 Definitions
L.3 Classification
L.4 Rated values
L.5 Product information
L.6 Constructional and performance requirements
L.7 Tests
Annex M(normative)Modular residual current devices(without integral current breaking device)
INTRODUCTION
M.1 Scope and object
M.2 Definitions
M.3 Classification
M.4 Characteristics of MRCDs
M.5 Product information
M.6 Normal service, mounting and transport conditions
M.7 Design and operating requirements
M.8 Tests
Annex N(normative)Electromagnetic compatibility (EMC) –Additional requirements and test methods for devicesnot covered by Annexes B, F and M
N.1 General
N.2 Immunity
N.3 Emission
Annex O(normative)Instantaneous trip circuit-breakers (ICB)
O.1 Scope
O.2 Definitions
O.3 Rated values
O.4 Product information
O.5 Constructional and performance requirements
O.6 Tests
Bibliography
Table
Table 2 – Ratio n between short-circuit making capacity and short-circuitbreaking capacity and related power factor (for a.c. circuit-breakers)
Table 3 – Minimum values of rated short-time withstand current
Table 4 – Selectivity categories
Table 5 – Preferred values of the rated control supply voltage,if different from that of the main circuit
Table 6 – Characteristics of the opening operation of inverse time-delay over-currentopening releases at the reference temperature
Table 7 – Temperature-rise limits for terminals and accessible parts
Table 8 – Number of operating cycles
Table 9 – Overall schema of test sequences
Table 9a – Applicability of test sequences according to the relationshipbetween Ics, Icu and Icw
Table 9b – Applicability of tests or test sequences to 1, 2 and 4-pole circuit-breakersaccording to the alternative programme 1 of 8.3.1.4
Table 9c – Applicability of tests or test sequences to 1, 2 and 3-pole circuit-breakersaccording to the alternative programme 2 of 8.3.1.4
Table 10 – Number of samples for test
Table 11 – Values of power factors and time constants corresponding to test currents
Table 12 – Test circuit characteristics for overload performance
Table B.1 – Operating characteristic for non-time-delay type
Table B.2 – Operating characteristic for time-delay-type having a limitingnon-actuating time of 0,06 s
Table B.3 – Requirements for CBRs functionally dependent on line voltage
Table B.4 – Additional test sequences
Table B.5 – Tripping current range for CBRs in case of an earth faultcomprising a d.c. component
Table F.1 – Test parameters for current dips and interruptions
Table J.1 − EMC − Immunity tests
Table J.2 – Reference data for immunity test specifications
Table J.3 − EMC − Emission tests
Table J.4 – Reference data for emission test specifications
Table M.1 – Product information
Table M.2 – Requirements for MRCDs with voltage source
Table M.3 – Test sequences
Figure
Figure 1 – Test arrangement (connecting cables not shown) for short-circuit tests
Figure A.1 – Over-current co-ordination between a circuit-breaker and a fuseor back-up protection by a fuse: operating characteristics
Figure A.2
Figure A.3
Figure A.4
Figure A.5
Figure A.6 – Example of test circuit for conditional short-circuit breaking capacitytests showing cable connections for a 3-pole circuit-breaker (C1)
Figure A.7 – Example of test circuit for the verification of selectivity
Figure B.1 – Test circuit for the verification of the operating characteristic (see B.8.2)
Figure B.2 – Test circuit for the verification of the limiting value of thenon-operating current under over-current conditions (see B.8.5)
Figure B.3 – Test circuit for the verification of the behaviourof CBRs classified under B.3.1.2.2
Figure B.4 – Current ring wave 0,5 μs/100 kHz
Figure B.5 – Example of test circuit for the verificationof resistance to unwanted tripping
Figure B.6 – Surge current wave 8/20 μs
Figure B.7 – Test circuit for the verification of resistance to unwanted trippingin case of flashover without follow-on current
Figure B.8 – Test circuit for the verification of the correct operation of CBRs,in the case of residual pulsating direct currents
Figure B.9 – Test circuit for the verification of the correct operation of CBRs,in the case of a residual pulsating direct current superimposedby a smooth direct residual current
Figure F.1 – Representation of test current produced by back-to-back thyristorsin accordance with F.4.1
Figure F.2 – Test circuit for immunity and emission tests in accordancewith F.4.1.3, F.4.2, F.4.3, F.4.6, F.4.7.1, F.5.4 and F.6.2 –Two phase poles in series
Figure F.3 – Test circuit for immunity and emission tests in accordancewith F.4.1.3, F.4.2, F.4.3, F.4.6, F.4.7.1, F.5.4 and F.6.2 –Three phase poles in series
Figure F.4 – Test circuit for immunity and emission tests in accordancewith F.4.1.3, F.4.2, F.4.3, F.4.6, F.4.7.1, F.5.4 and F.6.2 –Three-phase connection
Figure F.5 – Test current for the verification of the influence of the current dips andinterruptions in accordance with F.4.7.1
Figure F.6 – Circuit for electrical fast transients/bursts (EFT/B) immunity testin accordance with F.4.4 – Two phase poles in series
Figure F.7 – Circuit for electrical fast transients/bursts (EFT/B) immunity testin accordance with F.4.4 – Three phase poles in series
Figure F.8 – Circuit for electrical fast transients/bursts (EFT/B) immunity testin accordance with F.4.4 – Three-phase connection
Figure F.9 – Test circuit for the verification of the influence of surgesin the main circuit (line-to-earth) in accordance with F.4.5 –Two phase poles in series
Figure F.10 – Test circuit for the verification of the influence of surgesin the main circuit (line-to-earth) in accordance with F.4.5 –Three phase poles in series
Figure F.11 – Test circuit for the verification of the influence of surgesin the main circuit (line-to-earth) in accordance with F.4.5 –Three-phase connection
Figure F.12 – Test circuit for the verification of the influence of current surgesin the main circuit in accordance with F.4.5 –Two phase poles in series
Figure F.13 – Test circuit for the verification of the influence of current surgesin the main circuit in accordance with F.4.5 –Three phase poles in series
Figure F.14 – Test circuit for the verification of the influence of current surgesin the main circuit in accordance with F.4.5 –Three-phase connection
Figure F.15 – Temperature variation cycles at a specified rate of changein accordance with F.9.1
Figure F.16 – General test set up for immunity tests
Figure F.17 – Test set up for the verification of immunity to radiated r.f.electromagnetic fields
Figure F.18 – Test set up for the verification of immunity to electrical fasttransients/bursts (EFT/B) on power lines
Figure F.19 – Test set up for verification of immunity to electrical fasttransients/bursts (EFT/B) on signal lines
Figure F.20 – General test set-up for the verification of immunity to conducteddisturbances induced by r.f. fields (common mode)
Figure F.21 – Arrangement of connections for the verification of immunity to conducteddisturbances induced by r.f. fields - Two phase poles in series configuration
Figure F.22 – Arrangement of connections for the verification of immunity to conducteddisturbances induced by r.f. fields - Three phase poles in series configuration
Figure F.23 – Arrangement of connections for the verification of immunity to conducteddisturbances induced by r.f. fields – Three-phase configuration
Figure G.1 – Example of power loss measurement according to G.2.1
Figure G.2 – Example of power loss measurement according to G.2.2 and G.2.3
Figure J.1 – EUT mounted in a metallic enclosure
Figure J.2 – Test set up for the measurement of radiated r.f. emissions
Figure J.3 – Test set up for the verification of immunity to electrostatic discharges
Figure J.4 – Test set up for the verification of immunity to radiated r.f.electromagnetic fields
Figure J.5 – Test set up for the verification of immunity to electricalfast transients/bursts (EFT/B) on power lines
Figure J.6 – Test set up for the verification of immunity to electricalfast transients/bursts (EFT/B) on signal lines
Figure K.1 – Relationship between symbols and tripping characteristics
Figure K.2 – Template for characteristics of cut-off current versusprospective current from 1 kA to 200 kA
Figure K.3 – Template for characteristics of cut-off current versusprospective current from 0,01 kA to 200 kA
Figure K.4 – Template for characteristics of let-through energyversus prospective current from 1 kA to 200 kA
Figure K.5 – Template for characteristics of let-through energyversus prospective current from 0,01 kA to 200 kA
Figure K.6 – Example of the use of template K.2
Figure K.7 – Example of the use of template K.4
Figure M.1 – Test circuits for the verification of operation in the caseof a steady increase of residual current
Figure M.2 – Test circuits for the verification of operation in the caseof a sudden appearance of residual current (with breaking device)
Figure M.3 – Test circuits for the verification of operation in the case of a suddenappearance of residual current (without breaking device)
Figure M.4 – Test circuits for the verification of the limiting valueof non-operating current under overcurrent conditions
Figure M.5 – Test circuits for the verification of the resistance to unwanted trippingin the case of loading of the network capacitance
Figure M.6 – Test circuit for the verification of the resistance to unwanted trippingin the case of flashover without follow-on current
Figure M.7 – Test circuits for the verification of operation in the caseof a continuous rise of a residual pulsating direct current
Figure M.8 – Test circuits for the verification of operation in the caseof a sudden appearance of residual pulsating direct current(without breaking device)
Figure M.9 – Test circuits for the verification of operation in the caseof a sudden appearance of residual pulsating direct current(with breaking device)
Figure M.10 – Test circuits for the verification of operation in the case of a residualpulsating direct current superimposed by smooth direct current of 6 mA
Figure M.11 – Test circuits for the verification of operation in the caseof a slowly rising residual smooth direct current
Figure M.12 – Test circuits for the verification of operation in the case of a suddenappearance of residual smooth direct current (without breaking device)
Figure M.13 – Test circuits for the verification of operation in the caseof a sudden appearance of residual smooth direct current(with breaking device)
Figure M.14 – Test circuits for the verification of operation in the caseof a slowly rising residual current resulting from a fault in a circuit fedby a three-pulse star or a six-pulse bridge connection
Figure M.15 – Test circuits for the verification of operation in the case of a slowly risingresidual current resulting from a fault in a circuit fed bya two-pulse bridge connection line-to-line
Figure M.16 – Test circuit for the verification of the behaviour of MRCDswith separate sensing means in the case of a failureof the sensor means connection
Figure M.17 − Test circuit for the verification of the behaviour of MRCDwith separate sensing means under short-circuit conditions
Figure M.18 − Test circuit for the verification of the behaviour of MRCDwith integral sensing means under short-circuit conditions
Figure M.19 − Test circuit for the verification of the behaviour of terminal type MRCDunder short-circuit conditions
Figure M.20 – Verification of immunity to radiated r.f. electromagnetic fields –Test set-up for MRCD with separate sensing means(additional to the test of Annex B)
Figure M.22 – Verification of immunity to conducted disturbances induced by r.f. fields -Test set up for MRCD with separate sensing means(additional to the test of Annex B)
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AS/NZS IEC 60947.2:2015
COPYRIGHT
PREFACE
CONTENTS
1 General
1.1 Scope and object
1.2 Normative references
2 Definitions
3 Classification
4 Characteristics of circuit-breakers
4.1 Summary of characteristics
4.2 Type of circuit-breaker
4.3 Rated and limiting values of the main circuit
4.4 Selectivity categories
4.5 Control circuits
4.6 Auxiliary circuits
4.7 Releases
4.8 Integral fuses (integrally fused circuit-breakers)
5 Product information
5.1 Nature of the information
5.2 Marking
5.3 Instructions for installation, operation and maintenance
6 Normal service, mounting and transport conditions
7 Constructional and performance requirements
7.1 Constructional requirements
7.2 Performance requirements
7.3 Electromagnetic compatibility (EMC)
8 Tests
8.1 Kind of tests
8.2 Compliance with constructional requirements
8.3 Type tests
8.4 Routine tests
Annex A(normative)Co-ordination under short-circuit conditions betweena circuit-breaker and another short-circuit protective deviceassociated in the same circuit
A.1 Introduction
A.2 Scope and object
A.3 General requirements for the co-ordination of a circuit-breakerwith another SCPD
A.4 Type and characteristics of the associated SCPD
A.5 Verification of selectivity
A.6 Verification of back-up protection
Annex B(normative)Circuit-breakers incorporating residual current protection
INTRODUCTION
B.1 Scope and object
B.2 Definitions
B.3 Classification
B.4 Characteristics of CBRs concerning their residual current function
B.5 Marking
B.6 Normal service, mounting and transport conditions
B.7 Design and operating requirements
B.8 Tests
Annex C(normative)Individual pole short-circuit test sequence
C.1 General
C.2 Test of individual pole short-circuit breaking capacity
C.3 Verification of dielectric withstand
C.4 Verification of overload releases
Annex DVacant
Annex E(informative)Items subject to agreement between manufacturer and user
Annex F(normative)Additional tests for circuit-breakers withelectronic over-current protection
F.1 Scope
F.2 List of tests
F.3 General test conditions
F.4 Immunity tests
F.5 Emission tests
F.6 Suitability for multiple frequencies
F.7 Dry heat test
F.8 Damp heat test
F.9 Temperature variation cycles at a specified rate of change
Annex G(normative)Power loss
G.1 General
G.2 Test methods
G.3 Test procedure
Annex H(normative)Test sequence for circuit-breakers for IT systems
H.1 General
H.2 Individual pole short circuit
H.3 Verification of dielectric withstand
H.4 Verification of overload releases
H.5 Marking
Annex J(normative)Electromagnetic compatibility (EMC) –Requirements and test methods for circuit-breakers
J.1 General
J.2 Immunity
J.3 Emission
Annex K(informative)Glossary of symbols and graphical representation of characteristics
Annex L(normative)Circuit-breakers not fulfilling the requirementsfor overcurrent protection
L.1 Scope
L.2 Definitions
L.3 Classification
L.4 Rated values
L.5 Product information
L.6 Constructional and performance requirements
L.7 Tests
Annex M(normative)Modular residual current devices(without integral current breaking device)
INTRODUCTION
M.1 Scope and object
M.2 Definitions
M.3 Classification
M.4 Characteristics of MRCDs
M.5 Product information
M.6 Normal service, mounting and transport conditions
M.7 Design and operating requirements
M.8 Tests
Annex N(normative)Electromagnetic compatibility (EMC) –Additional requirements and test methods for devicesnot covered by Annexes B, F and M
N.1 General
N.2 Immunity
N.3 Emission
Annex O(normative)Instantaneous trip circuit-breakers (ICB)
O.1 Scope
O.2 Definitions
O.3 Rated values
O.4 Product information
O.5 Constructional and performance requirements
O.6 Tests
Bibliography
Table
Table 2 – Ratio n between short-circuit making capacity and short-circuitbreaking capacity and related power factor (for a.c. circuit-breakers)
Table 3 – Minimum values of rated short-time withstand current
Table 4 – Selectivity categories
Table 5 – Preferred values of the rated control supply voltage,if different from that of the main circuit
Table 6 – Characteristics of the opening operation of inverse time-delay over-currentopening releases at the reference temperature
Table 7 – Temperature-rise limits for terminals and accessible parts
Table 8 – Number of operating cycles
Table 9 – Overall schema of test sequences
Table 9a – Applicability of test sequences according to the relationshipbetween Ics, Icu and Icw
Table 9b – Applicability of tests or test sequences to 1, 2 and 4-pole circuit-breakersaccording to the alternative programme 1 of 8.3.1.4
Table 9c – Applicability of tests or test sequences to 1, 2 and 3-pole circuit-breakersaccording to the alternative programme 2 of 8.3.1.4
Table 10 – Number of samples for test
Table 11 – Values of power factors and time constants corresponding to test currents
Table 12 – Test circuit characteristics for overload performance
Table B.1 – Operating characteristic for non-time-delay type
Table B.2 – Operating characteristic for time-delay-type having a limitingnon-actuating time of 0,06 s
Table B.3 – Requirements for CBRs functionally dependent on line voltage
Table B.4 – Additional test sequences
Table B.5 – Tripping current range for CBRs in case of an earth faultcomprising a d.c. component
Table F.1 – Test parameters for current dips and interruptions
Table J.1 − EMC − Immunity tests
Table J.2 – Reference data for immunity test specifications
Table J.3 − EMC − Emission tests
Table J.4 – Reference data for emission test specifications
Table M.1 – Product information
Table M.2 – Requirements for MRCDs with voltage source
Table M.3 – Test sequences
Figure
Figure 1 – Test arrangement (connecting cables not shown) for short-circuit tests
Figure A.1 – Over-current co-ordination between a circuit-breaker and a fuseor back-up protection by a fuse: operating characteristics
Figure A.2
Figure A.3
Figure A.4
Figure A.5
Figure A.6 – Example of test circuit for conditional short-circuit breaking capacitytests showing cable connections for a 3-pole circuit-breaker (C1)
Figure A.7 – Example of test circuit for the verification of selectivity
Figure B.1 – Test circuit for the verification of the operating characteristic (see B.8.2)
Figure B.2 – Test circuit for the verification of the limiting value of thenon-operating current under over-current conditions (see B.8.5)
Figure B.3 – Test circuit for the verification of the behaviourof CBRs classified under B.3.1.2.2
Figure B.4 – Current ring wave 0,5 μs/100 kHz
Figure B.5 – Example of test circuit for the verificationof resistance to unwanted tripping
Figure B.6 – Surge current wave 8/20 μs
Figure B.7 – Test circuit for the verification of resistance to unwanted trippingin case of flashover without follow-on current
Figure B.8 – Test circuit for the verification of the correct operation of CBRs,in the case of residual pulsating direct currents
Figure B.9 – Test circuit for the verification of the correct operation of CBRs,in the case of a residual pulsating direct current superimposedby a smooth direct residual current
Figure F.1 – Representation of test current produced by back-to-back thyristorsin accordance with F.4.1
Figure F.2 – Test circuit for immunity and emission tests in accordancewith F.4.1.3, F.4.2, F.4.3, F.4.6, F.4.7.1, F.5.4 and F.6.2 –Two phase poles in series
Figure F.3 – Test circuit for immunity and emission tests in accordancewith F.4.1.3, F.4.2, F.4.3, F.4.6, F.4.7.1, F.5.4 and F.6.2 –Three phase poles in series
Figure F.4 – Test circuit for immunity and emission tests in accordancewith F.4.1.3, F.4.2, F.4.3, F.4.6, F.4.7.1, F.5.4 and F.6.2 –Three-phase connection
Figure F.5 – Test current for the verification of the influence of the current dips andinterruptions in accordance with F.4.7.1
Figure F.6 – Circuit for electrical fast transients/bursts (EFT/B) immunity testin accordance with F.4.4 – Two phase poles in series
Figure F.7 – Circuit for electrical fast transients/bursts (EFT/B) immunity testin accordance with F.4.4 – Three phase poles in series
Figure F.8 – Circuit for electrical fast transients/bursts (EFT/B) immunity testin accordance with F.4.4 – Three-phase connection
Figure F.9 – Test circuit for the verification of the influence of surgesin the main circuit (line-to-earth) in accordance with F.4.5 –Two phase poles in series
Figure F.10 – Test circuit for the verification of the influence of surgesin the main circuit (line-to-earth) in accordance with F.4.5 –Three phase poles in series
Figure F.11 – Test circuit for the verification of the influence of surgesin the main circuit (line-to-earth) in accordance with F.4.5 –Three-phase connection
Figure F.12 – Test circuit for the verification of the influence of current surgesin the main circuit in accordance with F.4.5 –Two phase poles in series
Figure F.13 – Test circuit for the verification of the influence of current surgesin the main circuit in accordance with F.4.5 –Three phase poles in series
Figure F.14 – Test circuit for the verification of the influence of current surgesin the main circuit in accordance with F.4.5 –Three-phase connection
Figure F.15 – Temperature variation cycles at a specified rate of changein accordance with F.9.1
Figure F.16 – General test set up for immunity tests
Figure F.17 – Test set up for the verification of immunity to radiated r.f.electromagnetic fields
Figure F.18 – Test set up for the verification of immunity to electrical fasttransients/bursts (EFT/B) on power lines
Figure F.19 – Test set up for verification of immunity to electrical fasttransients/bursts (EFT/B) on signal lines
Figure F.20 – General test set-up for the verification of immunity to conducteddisturbances induced by r.f. fields (common mode)
Figure F.21 – Arrangement of connections for the verification of immunity to conducteddisturbances induced by r.f. fields - Two phase poles in series configuration
Figure F.22 – Arrangement of connections for the verification of immunity to conducteddisturbances induced by r.f. fields - Three phase poles in series configuration
Figure F.23 – Arrangement of connections for the verification of immunity to conducteddisturbances induced by r.f. fields – Three-phase configuration
Figure G.1 – Example of power loss measurement according to G.2.1
Figure G.2 – Example of power loss measurement according to G.2.2 and G.2.3
Figure J.1 – EUT mounted in a metallic enclosure
Figure J.2 – Test set up for the measurement of radiated r.f. emissions
Figure J.3 – Test set up for the verification of immunity to electrostatic discharges
Figure J.4 – Test set up for the verification of immunity to radiated r.f.electromagnetic fields
Figure J.5 – Test set up for the verification of immunity to electricalfast transients/bursts (EFT/B) on power lines
Figure J.6 – Test set up for the verification of immunity to electricalfast transients/bursts (EFT/B) on signal lines
Figure K.1 – Relationship between symbols and tripping characteristics
Figure K.2 – Template for characteristics of cut-off current versusprospective current from 1 kA to 200 kA
Figure K.3 – Template for characteristics of cut-off current versusprospective current from 0,01 kA to 200 kA
Figure K.4 – Template for characteristics of let-through energyversus prospective current from 1 kA to 200 kA
Figure K.5 – Template for characteristics of let-through energyversus prospective current from 0,01 kA to 200 kA
Figure K.6 – Example of the use of template K.2
Figure K.7 – Example of the use of template K.4
Figure M.1 – Test circuits for the verification of operation in the caseof a steady increase of residual current
Figure M.2 – Test circuits for the verification of operation in the caseof a sudden appearance of residual current (with breaking device)
Figure M.3 – Test circuits for the verification of operation in the case of a suddenappearance of residual current (without breaking device)
Figure M.4 – Test circuits for the verification of the limiting valueof non-operating current under overcurrent conditions
Figure M.5 – Test circuits for the verification of the resistance to unwanted trippingin the case of loading of the network capacitance
Figure M.6 – Test circuit for the verification of the resistance to unwanted trippingin the case of flashover without follow-on current
Figure M.7 – Test circuits for the verification of operation in the caseof a continuous rise of a residual pulsating direct current
Figure M.8 – Test circuits for the verification of operation in the caseof a sudden appearance of residual pulsating direct current(without breaking device)
Figure M.9 – Test circuits for the verification of operation in the caseof a sudden appearance of residual pulsating direct current(with breaking device)
Figure M.10 – Test circuits for the verification of operation in the case of a residualpulsating direct current superimposed by smooth direct current of 6 mA
Figure M.11 – Test circuits for the verification of operation in the caseof a slowly rising residual smooth direct current
Figure M.12 – Test circuits for the verification of operation in the case of a suddenappearance of residual smooth direct current (without breaking device)
Figure M.13 – Test circuits for the verification of operation in the caseof a sudden appearance of residual smooth direct current(with breaking device)
Figure M.14 – Test circuits for the verification of operation in the caseof a slowly rising residual current resulting from a fault in a circuit fedby a three-pulse star or a six-pulse bridge connection
Figure M.15 – Test circuits for the verification of operation in the case of a slowly risingresidual current resulting from a fault in a circuit fed bya two-pulse bridge connection line-to-line
Figure M.16 – Test circuit for the verification of the behaviour of MRCDswith separate sensing means in the case of a failureof the sensor means connection
Figure M.17 − Test circuit for the verification of the behaviour of MRCDwith separate sensing means under short-circuit conditions
Figure M.18 − Test circuit for the verification of the behaviour of MRCDwith integral sensing means under short-circuit conditions
Figure M.19 − Test circuit for the verification of the behaviour of terminal type MRCDunder short-circuit conditions
Figure M.20 – Verification of immunity to radiated r.f. electromagnetic fields –Test set-up for MRCD with separate sensing means(additional to the test of Annex B)
Figure M.22 – Verification of immunity to conducted disturbances induced by r.f. fields -Test set up for MRCD with separate sensing means(additional to the test of Annex B)
AS/NZS IEC 60947.2:2015
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