AS/NZS IEC 61000.4.6:2024
Electromagnetic compatibility (EMC), Part 4.6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields
Standard identically adopts IEC 61000 4 6:2023, which establishes a common reference for evaluating the functional immunity of electrical and electronic equipment when subjected to conducted disturbances induced by RF fields. The test method in this document describes a consistent method to assess the immunity of an equipment or system against a specified phenomenon.
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AS/NZS IEC 61000.4.6:2024 Electromagnetic compatibility (EMC) Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields
Preface
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Test levels
6 Test equipment and level adjustment procedure
6.1 Test generator
6.2 Coupling and decoupling devices
6.2.1 General
6.2.2 Coupling/decoupling networks (CDNs)
6.2.3 Clamp injection devices
6.2.4 Direct injection devices
6.2.5 Decoupling networks
6.3 Verification of the common-mode impedance at the EUT port of coupling and decoupling devices
6.3.1 General
6.3.2 Insertion loss of the 150 Ω to 50 Ω adapters
6.4 Setting of the test generator
6.4.1 General
6.4.2 Setting of the output level at the EUT port of the coupling device
7 Test setup and injection methods
7.1 Test setup
7.2 EUT comprising a single unit
7.3 EUT comprising several units
7.4 Rules for selecting injection methods and test points
7.4.1 General
7.4.2 Injection method
7.4.3 Ports to be tested
7.5 CDN injection application
7.6 Clamp injection application
7.7 Direct injection application
8 Test procedure
9 Evaluation of the test results
10 Test report
Annex A (normative) EM and decoupling clamps
Annex B (informative) Selection criteria for the frequency range of application
Annex C (informative) Guidelines for selecting test levels
Annex D (informative) Information on coupling and decoupling networks
Annex E (informative) Information for the test generator specification
Annex F (informative) Test setup for large EUTs
Annex G (informative) Measurement uncertainty of the voltage test level
Annex H (informative) Testing with multiple signals
Annex I (informative) Port-to-port injection
Annex J (informative) Amplifier compression and non-linearity
Bibliography
Figure 1 — Diagram showing EM fields near the EUT due to common-mode currents on its cables
Figure 2 — Schematic setup for immunity test to RF conducted disturbances
Figure 3 — Example of unmodulated and modulated RF signal
Figure 4 — Test generator setup
Figure 5 — Principle of coupling and decoupling - Symbols used for the indicated setup principles
Figure 6 — Principle of coupling and decoupling - Principle of direct injection to screened cables
Figure 7 — Principle of coupling and decoupling - Principle of coupling to unscreened cables according to the CDN method
Figure 8 — Principle of coupling and decoupling - Principle of decoupling
Figure 9 — Example of circuit for level-setting setup in a 150 Ω test jig
Figure 10 — Example of circuit for evaluating the transmission loss of the current clamp level-setting
Figure 11 — Example of the setup geometry to verify the impedance characteristics of the coupling and decoupling devices
Figure 12 — Setup principle to verify Zce of the coupling and decoupling device
Figure 13 — Setup principle for measuring the insertion loss of two 150 Ω to 50 Ω adapters
Figure 14 — Circuit and construction of the 150 Ω to 50 Ω adapter
Figure 15 — Definition of a common-mode point for unscreened and screened cables
Figure 16 — Setup for level-setting at the EUT port of the coupling/decoupling devices
Figure 17 — Example of test setup with a single unit EUT with only one CDN for injection (top view)
Figure 18 — Example of test setup with a single unit EUT (top view) using multiple CDNs
Figure 19 — Example of a test setup with a multi-unit EUT (top view)
Figure 20 — Rules for selecting the injection method
Figure 21 — Immunity test for two-port EUT (when only one CDN can be used)
Figure 22 — General principle of a test setup using clamp injection devices
Figure 23 — Example of the test unit locations on the ground plane when using injection clamps (top view)
Figure A.1 — Example: Construction details of the EM clamp
Figure A.2 — Example: Concept of the EM clamp
Figure A.3 — Dimension of a reference plane
Figure A.4 — Test jig
Figure A.5 — Test jig with inserted clamp
Figure A.6 — Impedance / decoupling factor measurement setup
Figure A.7 — Typical examples for clamp impedance, three typical clamps
Figure A.8 — Typical examples for decoupling factors, three typical clamps
Figure A.9 — Normalization setup for coupling factor measurement
Figure A.10 — S21 coupling factor measurement setup
Figure A.11 — Typical examples for coupling factor, three typical clamps
Figure A.12 — Decoupling clamp characterization measurement setup
Figure A.13 — Typical examples for the decoupling clamp impedance
Figure A.14 — Typical examples for decoupling factors
Figure B.1 — Start frequency as function of cable length and equipment size
Figure D.1 — Example of a simplified diagram for the circuit of CDN-S1 used with screened cables (see 6.2.2.5)
Figure D.2 — Example of simplified diagram for the circuit of CDN-M1, CDN-M2 and CDN-M3 used with unscreened supply (mains) lines (see 6.2.2.2)
Figure D.3 — Example of a simplified diagram for the circuit of CDN-AF2 used with unscreened unbalanced lines (see 6.2.2.4)
Figure D.4 — Example of a simplified diagram for the circuit of CDN-T2, used with an unscreened balanced pair (see 6.2.2.3)
Figure D.5 — Example of a simplified diagram of the circuit of CDN-T4 used with unscreened balanced pairs (see 6.2.2.3)
Figure D.6 — Example of a simplified diagram of the circuit of CDN AF8 used with unscreened unbalanced lines (see 6.2.2.4)
Figure D.7 — Example of a simplified diagram of the circuit of CDN-T8 used with unscreened balanced pairs (see 6.2.2.3)
Figure F.1 — Example of large EUT test setup with elevated horizontal reference ground plane
Figure F.2 — Example of large EUT test setup with vertical reference ground plane
Figure G.1 — Example of influences upon voltage test level using CDN
Figure G.2 — Example of influences upon voltage test level using EM clamp
Figure G.3 — Example of influences upon voltage test level using current clamp
Figure G.4 — Example of influences upon voltage test level using direct injection
Figure G.5 — Circuit for level-setting setup of CDN
Figure H.1 — Test frequencies f1 and f2 and intermodulation frequencies of the second and third order
Figure I.1 — Example of setup, port-to-port injection
Figure J.1 — Amplifier linearity measurement setup
Figure J.2 — Linearity characteristic
Figure J.3 — Measurement setup for modulation depth
Figure J.4 — Spectrum of AM modulated signal
Table 1 — Test levels
Table 2 — Characteristics of the test generator
Table 3 — Main parameter of the combination of the coupling and decoupling device
Table 4 — Usage of CDNs
Table B.1 — Main parameter of the combination of the coupling and decoupling device when the frequency range of the test is extended above 80 MHz
Table E.1 — Required power amplifier output power to obtain a test level of 10 V
Table G.1 — CDN level-setting process
Table G.2 — CDN test process
Table G.3 — EM clamp level-setting process
Table G.4 — EM clamp test process
Table G.5 — Current clamp level-setting process
Table G.6 — Current clamp test process
Table G.7 — Direct injection level-setting process
Table G.8 — Direct injection test process
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AS/NZS IEC 61000.4.6:2024 Electromagnetic compatibility (EMC) Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields
Preface
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Test levels
6 Test equipment and level adjustment procedure
6.1 Test generator
6.2 Coupling and decoupling devices
6.2.1 General
6.2.2 Coupling/decoupling networks (CDNs)
6.2.3 Clamp injection devices
6.2.4 Direct injection devices
6.2.5 Decoupling networks
6.3 Verification of the common-mode impedance at the EUT port of coupling and decoupling devices
6.3.1 General
6.3.2 Insertion loss of the 150 Ω to 50 Ω adapters
6.4 Setting of the test generator
6.4.1 General
6.4.2 Setting of the output level at the EUT port of the coupling device
7 Test setup and injection methods
7.1 Test setup
7.2 EUT comprising a single unit
7.3 EUT comprising several units
7.4 Rules for selecting injection methods and test points
7.4.1 General
7.4.2 Injection method
7.4.3 Ports to be tested
7.5 CDN injection application
7.6 Clamp injection application
7.7 Direct injection application
8 Test procedure
9 Evaluation of the test results
10 Test report
Annex A (normative) EM and decoupling clamps
Annex B (informative) Selection criteria for the frequency range of application
Annex C (informative) Guidelines for selecting test levels
Annex D (informative) Information on coupling and decoupling networks
Annex E (informative) Information for the test generator specification
Annex F (informative) Test setup for large EUTs
Annex G (informative) Measurement uncertainty of the voltage test level
Annex H (informative) Testing with multiple signals
Annex I (informative) Port-to-port injection
Annex J (informative) Amplifier compression and non-linearity
Bibliography
Figure 1 — Diagram showing EM fields near the EUT due to common-mode currents on its cables
Figure 2 — Schematic setup for immunity test to RF conducted disturbances
Figure 3 — Example of unmodulated and modulated RF signal
Figure 4 — Test generator setup
Figure 5 — Principle of coupling and decoupling - Symbols used for the indicated setup principles
Figure 6 — Principle of coupling and decoupling - Principle of direct injection to screened cables
Figure 7 — Principle of coupling and decoupling - Principle of coupling to unscreened cables according to the CDN method
Figure 8 — Principle of coupling and decoupling - Principle of decoupling
Figure 9 — Example of circuit for level-setting setup in a 150 Ω test jig
Figure 10 — Example of circuit for evaluating the transmission loss of the current clamp level-setting
Figure 11 — Example of the setup geometry to verify the impedance characteristics of the coupling and decoupling devices
Figure 12 — Setup principle to verify Zce of the coupling and decoupling device
Figure 13 — Setup principle for measuring the insertion loss of two 150 Ω to 50 Ω adapters
Figure 14 — Circuit and construction of the 150 Ω to 50 Ω adapter
Figure 15 — Definition of a common-mode point for unscreened and screened cables
Figure 16 — Setup for level-setting at the EUT port of the coupling/decoupling devices
Figure 17 — Example of test setup with a single unit EUT with only one CDN for injection (top view)
Figure 18 — Example of test setup with a single unit EUT (top view) using multiple CDNs
Figure 19 — Example of a test setup with a multi-unit EUT (top view)
Figure 20 — Rules for selecting the injection method
Figure 21 — Immunity test for two-port EUT (when only one CDN can be used)
Figure 22 — General principle of a test setup using clamp injection devices
Figure 23 — Example of the test unit locations on the ground plane when using injection clamps (top view)
Figure A.1 — Example: Construction details of the EM clamp
Figure A.2 — Example: Concept of the EM clamp
Figure A.3 — Dimension of a reference plane
Figure A.4 — Test jig
Figure A.5 — Test jig with inserted clamp
Figure A.6 — Impedance / decoupling factor measurement setup
Figure A.7 — Typical examples for clamp impedance, three typical clamps
Figure A.8 — Typical examples for decoupling factors, three typical clamps
Figure A.9 — Normalization setup for coupling factor measurement
Figure A.10 — S21 coupling factor measurement setup
Figure A.11 — Typical examples for coupling factor, three typical clamps
Figure A.12 — Decoupling clamp characterization measurement setup
Figure A.13 — Typical examples for the decoupling clamp impedance
Figure A.14 — Typical examples for decoupling factors
Figure B.1 — Start frequency as function of cable length and equipment size
Figure D.1 — Example of a simplified diagram for the circuit of CDN-S1 used with screened cables (see 6.2.2.5)
Figure D.2 — Example of simplified diagram for the circuit of CDN-M1, CDN-M2 and CDN-M3 used with unscreened supply (mains) lines (see 6.2.2.2)
Figure D.3 — Example of a simplified diagram for the circuit of CDN-AF2 used with unscreened unbalanced lines (see 6.2.2.4)
Figure D.4 — Example of a simplified diagram for the circuit of CDN-T2, used with an unscreened balanced pair (see 6.2.2.3)
Figure D.5 — Example of a simplified diagram of the circuit of CDN-T4 used with unscreened balanced pairs (see 6.2.2.3)
Figure D.6 — Example of a simplified diagram of the circuit of CDN AF8 used with unscreened unbalanced lines (see 6.2.2.4)
Figure D.7 — Example of a simplified diagram of the circuit of CDN-T8 used with unscreened balanced pairs (see 6.2.2.3)
Figure F.1 — Example of large EUT test setup with elevated horizontal reference ground plane
Figure F.2 — Example of large EUT test setup with vertical reference ground plane
Figure G.1 — Example of influences upon voltage test level using CDN
Figure G.2 — Example of influences upon voltage test level using EM clamp
Figure G.3 — Example of influences upon voltage test level using current clamp
Figure G.4 — Example of influences upon voltage test level using direct injection
Figure G.5 — Circuit for level-setting setup of CDN
Figure H.1 — Test frequencies f1 and f2 and intermodulation frequencies of the second and third order
Figure I.1 — Example of setup, port-to-port injection
Figure J.1 — Amplifier linearity measurement setup
Figure J.2 — Linearity characteristic
Figure J.3 — Measurement setup for modulation depth
Figure J.4 — Spectrum of AM modulated signal
Table 1 — Test levels
Table 2 — Characteristics of the test generator
Table 3 — Main parameter of the combination of the coupling and decoupling device
Table 4 — Usage of CDNs
Table B.1 — Main parameter of the combination of the coupling and decoupling device when the frequency range of the test is extended above 80 MHz
Table E.1 — Required power amplifier output power to obtain a test level of 10 V
Table G.1 — CDN level-setting process
Table G.2 — CDN test process
Table G.3 — EM clamp level-setting process
Table G.4 — EM clamp test process
Table G.5 — Current clamp level-setting process
Table G.6 — Current clamp test process
Table G.7 — Direct injection level-setting process
Table G.8 — Direct injection test process
Previous versions
AS/NZS IEC 61000.4.6:2024
Online Library subscription information
Online library subscriptions provide a cost-effective solution for organisations of any size to access the latest standards, offering 24/7 access to a personalised catalogue. The service ensures subscribers have have the most up-to-date version of selected standards, incluing automatic updates for any amendments or versions. Pricing is dependent on the chosen standards and the number of concurrent users, with discounts applied from the standards PDF price. For customised subscriptions or further inquiries, contact the Online Library team.